What is ATPG?

ATPG stands for Automatic Test Pattern Generation. It is a methodology used in electronic design automation (EDA) to automatically generate test patterns for detecting manufacturing defects and functional faults in digital circuits after they have been fabricated. These test patterns are then applied to the manufactured chip during testing to verify its correctness. ATPG tools use various algorithms to achieve high fault coverage, meaning they aim to detect as many potential faults as possible. ATPG is crucial for ensuring the quality and reliability of integrated circuits.