ATPG Insights | Sumble

What is ATPG?

ATPG stands for Automatic Test Pattern Generation. It is a methodology used in electronic design automation (EDA) to automatically generate test patterns for detecting manufacturing defects and functional faults in digital circuits after they have been fabricated. These test patterns are then applied to the manufactured chip during testing to verify its correctness. ATPG tools use various algorithms to achieve high fault coverage, meaning they aim to detect as many potential faults as possible. ATPG is crucial for ensuring the quality and reliability of integrated circuits.

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What other technologies are related to ATPG?

ATPG Competitor Technologies

MBIST

Memory Built-In Self-Test (MBIST) is a competitor as it provides an alternative method for testing memory within a design, potentially reducing the reliance on ATPG for memory-specific faults.

mentioned alongside ATPG in 50% (740) of relevant job posts

LBIST

Logic Built-In Self-Test (LBIST) is a competitor because it provides an on-chip testing mechanism, decreasing reliance on external ATPG.

mentioned alongside ATPG in 67% (192) of relevant job posts

Memory BIST

Memory BIST is a competitor to ATPG specifically for testing memory blocks, providing an alternative, on-chip testing approach.

mentioned alongside ATPG in 46% (222) of relevant job posts

Logic BIST

Logic BIST is a competitor as it provides an on-chip testing mechanism, offering an alternative to ATPG for logic circuits.

mentioned alongside ATPG in 57% (169) of relevant job posts

BIST

Built-In Self-Test (BIST) is a competitor to ATPG as it performs testing on-chip, reducing the need for external test patterns.

mentioned alongside ATPG in 33% (133) of relevant job posts

ATPG Complementary Technologies

Scan compression

Scan compression techniques are complementary to ATPG, as they reduce the volume of test data and the time required for testing, making ATPG more efficient.

mentioned alongside ATPG in 84% (168) of relevant job posts

scan insertion

Scan insertion is complementary to ATPG as it makes the design more testable by ATPG tools.

mentioned alongside ATPG in 58% (236) of relevant job posts

fault simulation

Fault simulation is a complementary technology, used in ATPG flow to determine fault coverage and grade ATPG patterns.

mentioned alongside ATPG in 92% (132) of relevant job posts