MBIST (Memory Built-In Self-Test) is a technique used to test embedded memories within a system-on-a-chip (SoC). It involves integrating test circuitry directly into the memory or SoC to automatically generate test patterns, apply them to the memory, and analyze the responses to detect faults. MBIST is commonly used during manufacturing testing, system startup, and periodically during operation to ensure memory integrity.
Whether you're looking to get your foot in the door, find the right person to talk to, or close the deal — accurate, detailed, trustworthy, and timely information about the organization you're selling to is invaluable.
Use Sumble to: