What is LBIST?

LBIST stands for Logic Built-In Self-Test. It is a design technique used in integrated circuits to test the logic portions of the chip without external test equipment. LBIST typically involves generating test patterns on-chip, applying them to the logic under test, and analyzing the responses to determine if there are any faults. It is commonly used to reduce the cost and complexity of testing, improve test coverage, and enable at-speed testing.