TetraMAX is an automatic test pattern generation (ATPG) tool developed by Synopsys. It is used to create test patterns for manufacturing testing of integrated circuits (ICs). These patterns are used to detect manufacturing defects in the chips after they are produced. TetraMAX analyzes the design of the IC and automatically generates patterns that can stimulate various faults in the circuit. These patterns are then used to test the manufactured chips, ensuring their quality and reliability.
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