What is Memory BIST?

Memory Built-In Self-Test (Memory BIST) is a technique used to test embedded memories within a system. It involves integrating test circuitry directly onto the same chip as the memory itself. This circuitry can then perform various tests on the memory, such as writing and reading data patterns, to identify defects or errors. Memory BIST is commonly used during manufacturing to ensure memory quality and can also be used periodically during system operation to detect faults that may develop over time, improving system reliability.