Logic BIST Insights

What is Logic BIST?

Logic Built-In Self-Test (LBIST) is a design technique that allows a circuit to test itself. It involves adding on-chip hardware to generate test patterns and analyze the responses, eliminating the need for external test equipment during manufacturing or in-field testing. LBIST is commonly used to detect manufacturing defects and perform periodic in-system tests for reliability.

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What other technologies are related to Logic BIST?

Logic BIST Competitor Technologies

ATPG

Automatic Test Pattern Generation (ATPG) is a traditional method of test pattern generation for manufacturing test. Logic BIST generates test patterns on-chip.

mentioned alongside Logic BIST in 10% (169) of relevant job posts

Logic BIST Complementary Technologies

JTAG/IJTAG

JTAG/IJTAG provides a standard interface for accessing and controlling embedded test features, including Logic BIST, making it complementary.

mentioned alongside Logic BIST in 72% (89) of relevant job posts

Memory BIST

Memory BIST is analogous to Logic BIST, but targets memory arrays. It serves the same overall purpose of self-testing, and so is complementary in the context of system-level test.

What is Logic BIST?

What other technologies are related to Logic BIST?

Logic BIST Competitor Technologies

Logic BIST Complementary Technologies

Which job functions mention Logic BIST?

Which organizations are mentioning Logic BIST?