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ALD

ALD

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What is ALD?

Atomic Layer Deposition (ALD) is a thin-film deposition technique that deposits materials one atomic layer at a time. It is a self-limiting process based on sequential surface reactions. ALD is used to create highly conformal and uniform thin films for microelectronics, nanotechnology, and other applications where precise control over film thickness and composition is required. Common applications include semiconductor manufacturing, coating of nanoparticles, and fabrication of barrier layers.

What other technologies are related to ALD?

ALD Competitor Technologies

Plasma Enhanced ALD is a similar deposition technique that can offer advantages in terms of deposition temperature and film properties, making it a competitor.
mentioned alongside ALD in 97% (832) of relevant job posts
Plasma Enhanced CVD is a competing deposition technique often used for similar applications.
mentioned alongside ALD in 60% (1.1k) of relevant job posts
Epitaxy is a competing technique for growing thin films with specific crystal orientations.
mentioned alongside ALD in 90% (738) of relevant job posts
Silicon Carbide Epitaxy is a competing technique for growing thin films of Silicon Carbide with specific crystal orientations.
mentioned alongside ALD in 100% (222) of relevant job posts
Vertical Furnaces is a competing technique for batch processing of thin films.
mentioned alongside ALD in 100% (215) of relevant job posts
Chemical Vapor Deposition is a competing thin film deposition technique.
mentioned alongside ALD in 28% (743) of relevant job posts
Physical Vapor Deposition is a competing family of thin film deposition techniques.
mentioned alongside ALD in 17% (466) of relevant job posts
Low Pressure CVD is a competing thin film deposition technique.
mentioned alongside ALD in 34% (67) of relevant job posts

ALD Complementary Technologies

Ellipsometry is a characterization technique used to measure the thickness and optical properties of thin films deposited by ALD.
mentioned alongside ALD in 16% (168) of relevant job posts
Atomic Force Microscopy is used to characterize the surface morphology and roughness of ALD films.
mentioned alongside ALD in 7% (289) of relevant job posts
X-ray reflectivity is a technique used to measure the thickness, density, and roughness of thin films deposited by ALD.
mentioned alongside ALD in 23% (71) of relevant job posts

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