AFM Insights | Sumble

What is AFM?

Atomic Force Microscopy (AFM) is a technique used to image surfaces at the atomic level. It works by scanning a sharp tip over a surface and measuring the forces between the tip and the sample. This allows for the creation of detailed images of the surface topography and material properties. AFM is commonly used in materials science, nanotechnology, and biology to study surfaces, measure forces, and manipulate nanoscale objects.

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What other technologies are related to AFM?

AFM Competitor Technologies

profilometry

Profilometry, especially stylus profilometry, directly measures surface topography and roughness, similar to AFM. It is often a faster, lower resolution alternative for surface roughness measurements.

mentioned alongside AFM in 24% (110) of relevant job posts

SNOM

SNOM achieves optical resolution beyond the diffraction limit by scanning a probe in close proximity to the sample surface, similar to AFM. While it provides optical information, it also provides topographic data.

mentioned alongside AFM in 37% (54) of relevant job posts

AFM Complementary Technologies

ellipsometry

Ellipsometry measures changes in polarized light upon reflection, providing information on thin film thickness and refractive index. It's often used in conjunction with AFM to correlate topography with optical properties.

mentioned alongside AFM in 42% (444) of relevant job posts

XPS

XPS provides elemental composition and chemical state information. This complements AFM's topographical data, providing a more complete material characterization.

mentioned alongside AFM in 20% (888) of relevant job posts

TEM

TEM offers high-resolution imaging of internal structures. While it requires sample preparation that differs from AFM, it provides valuable complementary structural information at a different length scale.

mentioned alongside AFM in 15% (889) of relevant job posts