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AFM

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**AFM**

What is AFM?

Atomic Force Microscopy (AFM) is a technique used to image surfaces at the atomic level. It works by scanning a sharp tip over a surface and measuring the forces between the tip and the sample. This allows for the creation of detailed images of the surface topography and material properties. AFM is commonly used in materials science, nanotechnology, and biology to study surfaces, measure forces, and manipulate nanoscale objects.

Which organizations are mentioning AFM?

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