XPS

Auger electron spectroscopy (AES) is a surface-sensitive technique that provides elemental composition and chemical state information, similar to XPS, but with higher spatial resolution in some instruments. It can be a competitor or complementary depending on the application.

Auger electron spectroscopy (AES) is synonymous with Auger. AES is a surface-sensitive technique that provides elemental composition and chemical state information, similar to XPS, but with higher spatial resolution in some instruments. It can be a competitor or complementary depending on the application.

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides complementary surface elemental and molecular composition information with high sensitivity, but with different capabilities of quantification and chemical state analysis compared to XPS.

X-ray diffraction (XRD) provides complementary information about the crystalline structure and phase composition of materials, which is distinct from the elemental and chemical state information provided by XPS.

Transmission electron microscopy (TEM) provides high-resolution imaging of the microstructure and morphology of materials, complementing XPS which provides surface chemical composition information.