TEM stands for Transmission Electron Microscopy. It is a microscopy technique in which a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the electrons transmitted through the specimen, magnified and focused by an objective lens system. TEM is used to image a wide range of materials, including nanomaterials, biological samples, and semiconductors, providing high-resolution images of their internal structure.
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