TEM Insights | Sumble

What is TEM?

TEM stands for Transmission Electron Microscopy. It is a microscopy technique in which a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the electrons transmitted through the specimen, magnified and focused by an objective lens system. TEM is used to image a wide range of materials, including nanomaterials, biological samples, and semiconductors, providing high-resolution images of their internal structure.

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What other technologies are related to TEM?

TEM Competitor Technologies

SEM

SEM (Scanning Electron Microscopy) is a competitor to TEM, providing surface imaging with high resolution, though generally lower than TEM, and requires less sample preparation.

mentioned alongside TEM in 5% (4.1k) of relevant job posts

TEM Complementary Technologies

FIB

FIB (Focused Ion Beam) is used for sample preparation for TEM, allowing for precise thinning and sectioning of materials.

mentioned alongside TEM in 47% (1.1k) of relevant job posts

XPS

XPS (X-ray Photoelectron Spectroscopy) provides surface chemical composition information that complements TEM's structural and microstructural data.

mentioned alongside TEM in 33% (1.4k) of relevant job posts

XRD

XRD (X-ray Diffraction) provides bulk structural information, such as crystal structure and phase identification, which complements the localized structural information from TEM.

mentioned alongside TEM in 22% (1.5k) of relevant job posts