Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface-sensitive analytical technique used to determine the elemental and molecular composition of materials. It bombards a sample surface with pulsed ion beams, causing secondary ions to be ejected. These ions are then analyzed by a time-of-flight mass spectrometer, which measures their mass-to-charge ratio based on their flight time. TOF-SIMS is commonly used in materials science, biology, and pharmaceuticals for surface analysis, imaging, and depth profiling.
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