TOF-SIMS Insights

What is TOF-SIMS?

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface-sensitive analytical technique used to determine the elemental and molecular composition of materials. It bombards a sample surface with pulsed ion beams, causing secondary ions to be ejected. These ions are then analyzed by a time-of-flight mass spectrometer, which measures their mass-to-charge ratio based on their flight time. TOF-SIMS is commonly used in materials science, biology, and pharmaceuticals for surface analysis, imaging, and depth profiling.

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What other technologies are related to TOF-SIMS?

TOF-SIMS Competitor Technologies

D-SIMS

D-SIMS (Dynamic SIMS) is a form of Secondary Ion Mass Spectrometry that also performs elemental and isotopic analysis of surfaces, competing with TOF-SIMS.

mentioned alongside TOF-SIMS in 97% (178) of relevant job posts

SIMS

SIMS (Secondary Ion Mass Spectrometry) is a surface analysis technique that provides elemental and molecular information, making it a direct competitor to TOF-SIMS.

mentioned alongside TOF-SIMS in 2% (126) of relevant job posts

TOF-SIMS Complementary Technologies

XPS

XPS (X-ray Photoelectron Spectroscopy) provides information on the elemental composition and chemical states of a material's surface. It is complementary to TOF-SIMS, which is more sensitive to surface elements and molecules but provides less chemical state information.

mentioned alongside TOF-SIMS in 17% (741) of relevant job posts

EDX

EDX (Energy-Dispersive X-ray spectroscopy) is typically used to determine the elemental composition of a sample. It is complementary to TOF-SIMS as it provides bulk elemental information, while TOF-SIMS provides surface elemental and molecular information.

mentioned alongside TOF-SIMS in 11% (272) of relevant job posts

TEM

TEM (Transmission Electron Microscopy) provides high-resolution images of a material's microstructure. It is often used in conjunction with TOF-SIMS to correlate surface composition with internal structure.

mentioned alongside TOF-SIMS in 5% (300) of relevant job posts