ellipsometry Insights

What is ellipsometry?

Ellipsometry is an optical technique used to investigate the dielectric properties (complex refractive index or dielectric function) of thin films. It measures the change in polarization of light upon reflection or transmission and compares it to a model. It's commonly used to determine the thickness, refractive index, and other optical constants of thin films and multi-layer stacks in various fields like semiconductor manufacturing, materials science, and surface chemistry.

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What other technologies are related to ellipsometry?

ellipsometry Competitor Technologies

profilometry

Profilometry is a surface measurement technique that can provide information about film thickness and surface roughness, similar to ellipsometry.

mentioned alongside ellipsometry in 34% (157) of relevant job posts

AFM

AFM (Atomic Force Microscopy) is a surface characterization technique that can measure film thickness and surface topography, providing alternative methods to ellipsometry for some applications.

mentioned alongside ellipsometry in 11% (444) of relevant job posts

reflectometry

Reflectometry measures the reflectance of a surface as a function of wavelength or angle, which can be used to determine film thickness and optical constants, thus competing with ellipsometry.

mentioned alongside ellipsometry in 63% (58) of relevant job posts

interferometry

Interferometry, similar to ellipsometry, can be used to measure film thickness and refractive index based on the interference of light waves. It offers an alternative approach to characterizing thin films.

mentioned alongside ellipsometry in 9% (55) of relevant job posts

ellipsometry Complementary Technologies

XRR

XRR (X-ray Reflectivity) is used to measure the thickness, density, and roughness of thin films. The information obtained from XRR is similar to that of ellipsometry, but XRR is suitable for dense films, and the techniques can be used in conjunction.

mentioned alongside ellipsometry in 35% (109) of relevant job posts

XPS

XPS (X-ray Photoelectron Spectroscopy) provides information on the elemental composition and chemical states of a material's surface, which complements the thickness and optical properties data obtained from ellipsometry.

mentioned alongside ellipsometry in 6% (271) of relevant job posts

XRD

XRD (X-ray Diffraction) provides information on the crystal structure and orientation of materials, which can be used to better understand the films being characterized by ellipsometry.

mentioned alongside ellipsometry in 4% (268) of relevant job posts