profilometry Insights

What is profilometry?

Profilometry is a measurement technique used to determine the surface profile of an object. It measures the surface topography along a line or over an area. Commonly used for quality control, material science, and manufacturing, profilometry provides information about surface roughness, step heights, and other surface features. There are several types of profilometry techniques, including contact (stylus) and non-contact (optical) methods.

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What other technologies are related to profilometry?

profilometry Competitor Technologies

ellipsometry

Ellipsometry is an optical technique used to characterize the thickness and refractive index of thin films. It is a competitor to profilometry, which also measures surface topography and film thickness.

mentioned alongside profilometry in 15% (157) of relevant job posts

AFM

Atomic Force Microscopy (AFM) is a technique used to image surfaces at the nanoscale. It is a competitor to profilometry, as it also provides high-resolution surface topography information.

mentioned alongside profilometry in 3% (110) of relevant job posts

profilometry Complementary Technologies

optical microscopy

Optical microscopy can provide visual context and larger-area imaging that complements the high-resolution, smaller-area data obtained by profilometry.

mentioned alongside profilometry in 3% (59) of relevant job posts

SEM

Scanning Electron Microscopy (SEM) provides high-resolution surface imaging that can be used in conjunction with profilometry to characterize surface features.

mentioned alongside profilometry in 0% (184) of relevant job posts