profilometry
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What is profilometry?
Profilometry is a measurement technique used to determine the surface profile of an object. It measures the surface topography along a line or over an area. Commonly used for quality control, material science, and manufacturing, profilometry provides information about surface roughness, step heights, and other surface features. There are several types of profilometry techniques, including contact (stylus) and non-contact (optical) methods.
What other technologies are related to profilometry?
profilometry Competitor Technologies
ellipsometry
Ellipsometry is an optical technique used to characterize the thickness and refractive index of thin films. It is a competitor to profilometry, which also measures surface topography and film thickness.
AFM
Atomic Force Microscopy (AFM) is a technique used to image surfaces at the nanoscale. It is a competitor to profilometry, as it also provides high-resolution surface topography information.
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profilometry Complementary Technologies
optical microscopy
Optical microscopy can provide visual context and larger-area imaging that complements the high-resolution, smaller-area data obtained by profilometry.
SEM
Scanning Electron Microscopy (SEM) provides high-resolution surface imaging that can be used in conjunction with profilometry to characterize surface features.
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Which job functions commonly mention profilometry?
Materials Engineer
0.3% of all Materials Engineer jobs mention profilometry
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jobs on Sumble
Integration Engineer
19 Integration Engineer jobs mention profilometry
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jobs on Sumble
Scientist
38 Scientist jobs mention profilometry
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jobs on Sumble
Researcher
40 Researcher jobs mention profilometry
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jobs on Sumble
Engineer
228 Engineer jobs mention profilometry
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jobs on Sumble
Which organizations are mentioning profilometry?
Los Alamos National Laboratory
Other Services (except Public Administration)
University of Colorado
Educational Services
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