What is scanning electron microscopy?

Scanning electron microscopy (SEM) is a type of electron microscopy that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. SEM is commonly used for characterizing materials at high magnifications, analyzing surface features, and determining the elemental composition of samples. It finds applications in diverse fields such as materials science, biology, and forensics.