atomic force microscopy Insights

What is atomic force microscopy?

Atomic Force Microscopy (AFM) is a technique used to image surfaces at the atomic level. A sharp tip, attached to a cantilever, scans the surface. Interactions between the tip and the surface cause the cantilever to bend, which is measured by a sensor. This allows for the creation of a high-resolution image of the surface topography and can also be used to manipulate nanoscale objects.

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What other technologies are related to atomic force microscopy?

atomic force microscopy Competitor Technologies

scanning electron microscopy

SEM is a competing microscopy technique, providing high-resolution surface imaging, but often requiring sample preparation that AFM does not. Both provide surface information, but AFM can also measure forces.

mentioned alongside atomic force microscopy in 10% (157) of relevant job posts

electron microscopy

Electron microscopy, in general, competes with AFM as a high-resolution imaging technique. While electron microscopy requires vacuum and can be destructive, it offers different capabilities, but the general principle competes with AFM.

mentioned alongside atomic force microscopy in 4% (85) of relevant job posts

optical microscopy

Optical microscopy competes with AFM for lower resolution imaging. AFM offers much higher resolution at the expense of complexity and field of view, but both can obtain images.

mentioned alongside atomic force microscopy in 3% (63) of relevant job posts

atomic force microscopy Complementary Technologies

X-ray photoelectron spectroscopy

XPS provides information on the elemental composition and chemical states of a material's surface. This complements AFM, which provides topographical and mechanical property information. Together they can provide a more complete surface characterization.

mentioned alongside atomic force microscopy in 20% (56) of relevant job posts