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atomic force microscopy

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**atomic force microscopy**

What is atomic force microscopy?

Atomic Force Microscopy (AFM) is a technique used to image surfaces at the atomic level. A sharp tip, attached to a cantilever, scans the surface. Interactions between the tip and the surface cause the cantilever to bend, which is measured by a sensor. This allows for the creation of a high-resolution image of the surface topography and can also be used to manipulate nanoscale objects.

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