X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state, and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0-10 nm of the material being analyzed.
This tech insight summary was produced by Sumble. We provide rich account intelligence data.
On our web app, we make a lot of our data available for browsing at no cost.
We have two paid products, Sumble Signals and Sumble Enrich, that integrate with your internal sales systems.