transmission electron microscopy Insights

What is transmission electron microscopy?

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the electrons transmitted through the specimen, magnified and focused onto an imaging device, such as a fluorescent screen, photographic film, or sensor. TEM is used in materials science, biology, and nanotechnology to visualize the microstructure of materials, including details about the crystal structure, morphology, and composition.

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What other technologies are related to transmission electron microscopy?

transmission electron microscopy Competitor Technologies

scanning electron microscopy

SEM provides surface imaging capabilities that can, in some cases, be an alternative to TEM for characterizing materials, although TEM offers higher resolution.

mentioned alongside transmission electron microscopy in 16% (238) of relevant job posts

transmission electron microscopy Complementary Technologies

atom probe tomography

APT provides 3D atomic-scale composition information, which complements the structural information obtained from TEM.

mentioned alongside transmission electron microscopy in 53% (70) of relevant job posts

focused ion beam

FIB is used to prepare samples for TEM, making it a complementary technique.

mentioned alongside transmission electron microscopy in 26% (74) of relevant job posts

X-ray diffraction

XRD provides information on the crystal structure and phase composition of materials, which complements the high-resolution imaging capabilities of TEM.

mentioned alongside transmission electron microscopy in 9% (152) of relevant job posts