focused ion beam Insights

What is focused ion beam?

Focused Ion Beam (FIB) is a technique used for site-specific ablation, deposition, and imaging using a focused beam of ions, typically gallium. It's commonly used in semiconductor manufacturing for circuit edit and failure analysis, as well as in materials science for preparing samples for transmission electron microscopy (TEM).

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What other technologies are related to focused ion beam?

focused ion beam Competitor Technologies

transmission electron microscopy

Transmission electron microscopy (TEM) is a competing technique for high-resolution imaging and material analysis, often used for similar applications as focused ion beam (FIB).

mentioned alongside focused ion beam in 10% (74) of relevant job posts

focused ion beam Complementary Technologies

scanning electron microscope

Scanning electron microscopy (SEM) is often used in conjunction with FIB. SEM provides surface imaging capabilities, while FIB is used for milling and cross-sectioning to reveal subsurface structures. Thus, they complement each other in materials characterization.

mentioned alongside focused ion beam in 11% (54) of relevant job posts

scanning electron microscopy

Scanning electron microscopy (SEM) is often used in conjunction with FIB. SEM provides surface imaging capabilities, while FIB is used for milling and cross-sectioning to reveal subsurface structures. Thus, they complement each other in materials characterization.

mentioned alongside focused ion beam in 5% (77) of relevant job posts