scanning electron microscope Insights

What is scanning electron microscope?

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with the atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the detected signal to produce an image. SEMs are used in a wide range of fields, including materials science, biology, and nanotechnology, for high-resolution imaging and analysis of surfaces.

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What other technologies are related to scanning electron microscope?

scanning electron microscope Competitor Technologies

optical microscope

Optical microscopy is a competing technology to scanning electron microscopy (SEM), although at a much lower resolution. Optical microscopes are easier to use and less expensive, but do not offer the high magnification and resolution capabilities of SEM. They are used for different applications.

mentioned alongside scanning electron microscope in 14% (52) of relevant job posts

scanning electron microscope Complementary Technologies

focused ion beam

Focused ion beam (FIB) is often used in conjunction with scanning electron microscopy (SEM) for sample preparation, modification, and analysis. FIB can mill away material to reveal subsurface structures that can then be imaged by the SEM. Thus, FIB provides capabilities that complement SEM.

mentioned alongside scanning electron microscope in 19% (54) of relevant job posts