scanning electron microscope
**scanning electron microscope**
What is scanning electron microscope?
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with the atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the detected signal to produce an image. SEMs are used in a wide range of fields, including materials science, biology, and nanotechnology, for high-resolution imaging and analysis of surfaces.
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