X-ray diffraction (XRD) is a technique used to determine the atomic and molecular structure of a crystalline material. A beam of X-rays strikes the material and diffracts in specific directions. By measuring the angles and intensities of these diffracted beams, a diffraction pattern is obtained. This pattern provides information about the spacing between the planes of atoms in the material, allowing for the identification of the material's crystal structure, phase composition, crystallite size, and strain.
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