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Scanning Electron Microscopy (SEM)

Last updated May 21, 2025, generated by Sumble

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What is Scanning Electron Microscopy (SEM)?

Scanning Electron Microscopy (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography, composition, and other properties. SEM is commonly used for high-resolution imaging of surfaces, analyzing the elemental composition of materials, and examining the structure of biological specimens.

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What other technologies are related to Scanning Electron Microscopy (SEM)?

Scanning Electron Microscopy (SEM) Competitor Technologies

Transmission Electron Microscopy (TEM)

TEM, like SEM, provides high-resolution imaging of materials. TEM requires samples to be much thinner than SEM, but achieves higher resolution.

atomic force microscopy (AFM)

AFM is an alternative microscopy technique that can achieve atomic resolution imaging of surfaces. Unlike SEM, AFM does not require conductive samples. It is often used to obtain information similar to what can be obtained with SEM.

Number of organizations that mention technology

Scanning Electron Microscopy (SEM)

Transmission Electron Microscopy (TEM)

atomic force microscopy (AFM)

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Scanning Electron Microscopy (SEM) Complementary Technologies

Small/Large Dual Beam (SDB/LDB)

No summary available

Dual beam instruments often combine a focused ion beam (FIB) with SEM. The FIB is used to prepare samples for SEM or TEM by milling away material. This makes SDB/LDB complementary.

$x-ray diffraction (XRD)$

x-ray diffraction (XRD)

XRD provides information on the crystallographic structure and composition of materials. This complements SEM, which provides surface morphology information.

X-ray photoelectron spectroscopy (XPS)

XPS is a surface-sensitive technique that provides elemental composition and chemical state information. SEM can be used to image a sample and XPS can provide quantitative elemental analysis of the surface. Thus, XPS complements SEM.

Number of organizations that mention technology

Scanning Electron Microscopy (SEM)

Small/Large Dual Beam (SDB/LDB)

x-ray diffraction (XRD)

X-ray photoelectron spectroscopy (XPS)

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Which job functions commonly mention Scanning Electron Microscopy (SEM)?

Nanotechnology Engineer

20.0% of all Nanotechnology Engineer jobs mention Scanning Electron Microscopy (SEM)

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Materials Engineer

0.3% of all Materials Engineer jobs mention Scanning Electron Microscopy (SEM)

View 22 jobs on Sumble

Research Scientist

0.1% of all Research Scientist jobs mention Scanning Electron Microscopy (SEM)

View 34 jobs on Sumble

72 Scientist jobs mention Scanning Electron Microscopy (SEM)

View 72 jobs on Sumble

102 Researcher jobs mention Scanning Electron Microscopy (SEM)

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