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Scanning Electron Microscopy (SEM)

Last updated May 16, 2025, generated by Sumble

What is Scanning Electron Microscopy (SEM)?

Scanning Electron Microscopy (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography, composition, and other properties. SEM is commonly used for high-resolution imaging of surfaces, analyzing the elemental composition of materials, and examining the structure of biological specimens.

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What other technologies are related to Scanning Electron Microscopy (SEM)?

Scanning Electron Microscopy (SEM) Competitor Technologies

Transmission Electron Microscopy (TEM)

TEM, like SEM, provides high-resolution imaging of materials. TEM requires samples to be much thinner than SEM, but achieves higher resolution.

mentioned alongside Scanning Electron Microscopy (SEM) in 64% (167) of relevant job posts

atomic force microscopy (AFM)

AFM is an alternative microscopy technique that can achieve atomic resolution imaging of surfaces. Unlike SEM, AFM does not require conductive samples. It is often used to obtain information similar to what can be obtained with SEM.

mentioned alongside Scanning Electron Microscopy (SEM) in 48% (93) of relevant job posts

Scanning Electron Microscopy (SEM) Complementary Technologies

Small/Large Dual Beam (SDB/LDB)

Dual beam instruments often combine a focused ion beam (FIB) with SEM. The FIB is used to prepare samples for SEM or TEM by milling away material. This makes SDB/LDB complementary.

mentioned alongside Scanning Electron Microscopy (SEM) in 100% (86) of relevant job posts

x-ray diffraction (XRD)

XRD provides information on the crystallographic structure and composition of materials. This complements SEM, which provides surface morphology information.

mentioned alongside Scanning Electron Microscopy (SEM) in 44% (179) of relevant job posts

X-ray photoelectron spectroscopy (XPS)

XPS is a surface-sensitive technique that provides elemental composition and chemical state information. SEM can be used to image a sample and XPS can provide quantitative elemental analysis of the surface. Thus, XPS complements SEM.

mentioned alongside Scanning Electron Microscopy (SEM) in 47% (59) of relevant job posts