Tech Insights

Transmission Electron Microscopy (TEM)

Last updated May 17, 2025, generated by Sumble

What is Transmission Electron Microscopy (TEM)?

Transmission Electron Microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through an ultra-thin specimen, interacting with the specimen as it passes through. An image is formed from the electrons transmitted through the specimen, magnified and focused onto an imaging device, such as a fluorescent screen, photographic film, or a sensor such as a CCD camera. TEM is used in materials science, biology, nanotechnology, and other fields for high-resolution imaging and analysis of the internal structure of materials and biological samples.

Find organizations using Transmission Electron Microscopy (TEM) on Sumble →

What other technologies are related to Transmission Electron Microscopy (TEM)?

Transmission Electron Microscopy (TEM) Competitor Technologies

Scanning Electron Microscopy (SEM)

SEM provides surface imaging and compositional information, often at lower resolution than TEM, but with simpler sample preparation. It can be considered a competitor for applications where surface information is sufficient and high resolution is not required.

mentioned alongside Transmission Electron Microscopy (TEM) in 26% (167) of relevant job posts

Transmission Electron Microscopy (TEM) Complementary Technologies

Small/Large Dual Beam (SDB/LDB)

Dual Beam systems (focused ion beam combined with SEM) are often used for sample preparation for TEM, allowing for precise thinning and manipulation of samples. Thus, they are complementary.

mentioned alongside Transmission Electron Microscopy (TEM) in 100% (86) of relevant job posts