Tech Insights

atomic force microscopy (AFM)

Last updated May 16, 2025, generated by Sumble

What is atomic force microscopy (AFM)?

Atomic force microscopy (AFM) is a technique used to image surfaces at the atomic level. A sharp tip, typically made of silicon or silicon nitride, is scanned across the surface. Interactions between the tip and the surface are measured and used to create an image of the surface topography. AFM is used in various fields, including materials science, nanotechnology, and biology, to characterize materials, study surface properties, and manipulate nanoscale structures.

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What other technologies are related to atomic force microscopy (AFM)?

atomic force microscopy (AFM) Competitor Technologies

Scanning Electron Microscopy (SEM)

SEM is a competitor to AFM because both are used for high-resolution surface imaging. While SEM typically requires conductive samples and operates in a vacuum, AFM can image a wider range of materials in various environments.

mentioned alongside atomic force microscopy (AFM) in 14% (93) of relevant job posts

atomic force microscopy (AFM) Complementary Technologies

x-ray diffraction (XRD)

XRD is complementary to AFM because it provides information about the crystallographic structure and composition of a material, while AFM provides information about the surface topography. Combining these techniques gives a more complete picture of the material's properties.

mentioned alongside atomic force microscopy (AFM) in 17% (70) of relevant job posts

Raman spectroscopy

Raman spectroscopy is complementary to AFM as it provides information about the chemical composition and molecular structure of a sample, while AFM provides topographical information. Tip-enhanced Raman spectroscopy (TERS) can be combined with AFM for nanoscale chemical imaging.

mentioned alongside atomic force microscopy (AFM) in 3% (55) of relevant job posts