What is atomic force microscopy (AFM)?

Atomic force microscopy (AFM) is a technique used to image surfaces at the atomic level. A sharp tip, typically made of silicon or silicon nitride, is scanned across the surface. Interactions between the tip and the surface are measured and used to create an image of the surface topography. AFM is used in various fields, including materials science, nanotechnology, and biology, to characterize materials, study surface properties, and manipulate nanoscale structures.