Boundary Scan Insights

What is Boundary Scan?

Boundary scan is a testing method that provides access to the internal circuitry of an integrated circuit (IC) without using physical probes. It allows testing of board interconnects and IC functionality by using a shift register architecture at the IC's boundary pins. It's commonly used for board-level testing, debugging, and in-system programming.

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What other technologies are related to Boundary Scan?

Boundary Scan Competitor Technologies

Flying Probe

Flying probe testing is an alternative method for detecting manufacturing defects. While boundary scan uses embedded scan chains, flying probe uses physical probes.

mentioned alongside Boundary Scan in 27% (89) of relevant job posts

In-circuit Test

In-circuit test (ICT) is a competing method for detecting manufacturing defects. Like flying probe, it uses physical probes to access the circuit, unlike boundary scan which utilizes embedded features.

mentioned alongside Boundary Scan in 36% (53) of relevant job posts

ICT

ICT (In-Circuit Test) is a competing method for detecting manufacturing defects, similar to flying probe testing.

mentioned alongside Boundary Scan in 1% (55) of relevant job posts

Boundary Scan Complementary Technologies

Memory BIST

Memory BIST (MBIST) is often used alongside boundary scan to test embedded memories. Both are DFT techniques.

mentioned alongside Boundary Scan in 29% (141) of relevant job posts

MBIST

MBIST (Memory Built-In Self-Test) is a complementary DFT technique used to test embedded memories, often used with boundary scan.

mentioned alongside Boundary Scan in 13% (197) of relevant job posts

ATPG

Automatic Test Pattern Generation (ATPG) tools are used to create test vectors for boundary scan, as well as other DFT techniques like scan insertion.

mentioned alongside Boundary Scan in 12% (197) of relevant job posts