SEM/EDX refers to Scanning Electron Microscopy (SEM) combined with Energy-Dispersive X-ray spectroscopy (EDX). SEM produces high-resolution images of a sample's surface by scanning it with a focused electron beam and detecting the emitted electrons. EDX is used to determine the elemental composition of the sample by analyzing the characteristic X-rays emitted when the electron beam interacts with the sample. This combined technique is commonly used for materials characterization, failure analysis, and forensic science to determine both the morphology and elemental makeup of a sample.
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