X-ray fluorescence (XRF) is a non-destructive analytical technique used to determine the elemental composition of a material. A sample is irradiated with high-energy X-rays, which causes the atoms within the sample to emit secondary (or fluorescent) X-rays. The energy and intensity of these fluorescent X-rays are characteristic of specific elements, allowing for both qualitative and quantitative analysis. XRF is commonly used in a wide range of applications, including materials science, environmental monitoring, archaeology, and quality control in various industries.
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