XRF Insights | Sumble

What is XRF?

X-ray fluorescence (XRF) is a non-destructive analytical technique used to determine the elemental composition of a material. A sample is irradiated with high-energy X-rays, which causes the atoms within the sample to emit secondary (or fluorescent) X-rays. The energy and intensity of these fluorescent X-rays are characteristic of specific elements, allowing for both qualitative and quantitative analysis. XRF is commonly used in a wide range of applications, including materials science, environmental monitoring, archaeology, and quality control in various industries.

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What other technologies are related to XRF?

XRF Competitor Technologies

ICP-OES

Inductively Coupled Plasma - Optical Emission Spectrometry is used for elemental analysis, similar to XRF, and can be considered a competing technology for certain applications.

mentioned alongside XRF in 13% (619) of relevant job posts

OES

Optical Emission Spectrometry is another method for elemental analysis, competing with XRF.

mentioned alongside XRF in 37% (188) of relevant job posts

LECO

LECO instruments are used for elemental analysis, particularly for carbon, sulfur, nitrogen, and oxygen, and thus compete with XRF for specific elemental analyses.

mentioned alongside XRF in 36% (182) of relevant job posts

ICP-MS

Inductively Coupled Plasma - Mass Spectrometry is another quantitative method for elemental analysis, and often is capable of higher sensitivity than XRF. This makes it a direct competitor.

mentioned alongside XRF in 8% (596) of relevant job posts

LIBS

Laser-Induced Breakdown Spectroscopy is another elemental analysis technique, competing with XRF.

mentioned alongside XRF in 32% (94) of relevant job posts

AAS

Atomic Absorption Spectroscopy is used for elemental analysis in liquid samples, and can be considered a competing technology to XRF.

mentioned alongside XRF in 8% (184) of relevant job posts

XRF Complementary Technologies

XRD

X-ray Diffraction provides information about the crystallographic structure and composition of materials, complementary to the elemental analysis provided by XRF.

mentioned alongside XRF in 21% (1.4k) of relevant job posts

XPS

X-ray Photoelectron Spectroscopy provides information about the elemental composition and chemical states of elements, especially at the surface, complementing the bulk elemental analysis of XRF.

mentioned alongside XRF in 12% (515) of relevant job posts

XRR

X-ray Reflectivity is a surface-sensitive technique that can provide information on thin film thickness, density, and roughness. Useful for thin film characterization together with XRF.

mentioned alongside XRF in 38% (119) of relevant job posts