SEM/EDS Insights

What is SEM/EDS?

SEM/EDS refers to Scanning Electron Microscopy combined with Energy-Dispersive X-ray Spectroscopy. SEM uses a focused beam of electrons to scan the surface of a sample, creating high-resolution images of its microstructure. EDS, often integrated with SEM, analyzes the X-rays emitted from the sample during electron bombardment to determine the elemental composition and distribution within the sample. It is commonly used in materials science, forensics, and various industries for analyzing the morphology and chemical makeup of materials.

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What other technologies are related to SEM/EDS?

SEM/EDS Competitor Technologies

XRF

XRF is an elemental analysis technique that, like EDS, can determine the elemental composition of a sample. However, XRF typically has lower spatial resolution than EDS.

mentioned alongside SEM/EDS in 4% (225) of relevant job posts

ICP-OES

ICP-OES is an elemental analysis technique that, like EDS, can determine the elemental composition of a sample. However, ICP-OES requires sample digestion and provides bulk elemental composition.

mentioned alongside SEM/EDS in 2% (76) of relevant job posts

ICP-MS

ICP-MS is an elemental analysis technique that, like EDS, can determine the elemental composition of a sample. However, ICP-MS requires sample digestion and provides bulk elemental composition.

mentioned alongside SEM/EDS in 1% (55) of relevant job posts

SEM/EDS Complementary Technologies

FTIR

FTIR provides information about the molecular vibrations and functional groups present in a sample, which complements the elemental composition and morphology data obtained from SEM/EDS.

mentioned alongside SEM/EDS in 3% (503) of relevant job posts

XRD

XRD provides information about the crystalline structure and phases present in a sample, which is complementary to the elemental analysis and imaging provided by SEM/EDS.

mentioned alongside SEM/EDS in 5% (318) of relevant job posts

optical microscopy

Optical microscopy provides lower-magnification images of the sample, which can be useful for identifying areas of interest for higher-resolution SEM/EDS analysis.

mentioned alongside SEM/EDS in 8% (163) of relevant job posts