X-ray fluorescence (XRF) is a non-destructive analytical technique used to determine the elemental composition of a material. A sample is irradiated with high-energy X-rays, causing its constituent atoms to emit secondary, or fluorescent, X-rays. The energy and intensity of these fluorescent X-rays are characteristic of specific elements, allowing for both qualitative and quantitative analysis of the sample's elemental makeup. XRF is commonly used in a wide range of applications, including environmental monitoring, geology, archaeology, and material science, for analyzing solids, liquids, and powders.
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